CaltechCONF
  A Caltech Library Service

Browse by Eprint ID

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Number of items: 1.

Shaver, D. C. (1981) Electron Beam Testing and Restructuring of Integrated Circuits. In: Proceedings of the Second Caltech Conference on Very Large Scale Integration. California Institute of Technology , Pasadena, CA, pp. 111-126. http://resolver.caltech.edu/CaltechCONF:20120508-102529066

This list was generated on Wed Jul 26 01:00:09 2017 PDT.