A Caltech Library Service

Browse by Eprint ID

Number of items: 1.

Shaver, D. C. (1981) Electron Beam Testing and Restructuring of Integrated Circuits. In: Proceedings of the Second Caltech Conference on Very Large Scale Integration. California Institute of Technology , Pasadena, CA, pp. 111-126. https://resolver.caltech.edu/CaltechCONF:20120508-102529066

This list was generated on Mon Dec 2 23:56:12 2024 UTC.

CaltechCONF is powered by EPrints 3.3 which is developed by the School of Electronics and Computer Science at the University of Southampton. More information and software credits.