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Jump to: Book Section Number of items: 1. Book SectionShaver, D. C. (1981) Electron Beam Testing and Restructuring of Integrated Circuits. In: Proceedings of the Second Caltech Conference on Very Large Scale Integration. California Institute of Technology , Pasadena, CA, pp. 111-126. https://resolver.caltech.edu/CaltechCONF:20120508-102529066 |