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Buehler, Martin G. and Linholm, Loren W. (1981) The Rolf of Test Chips in Coordinating Logic and Circuit Design and Layout Aids for VLSI. In: Proceedings of the Second Caltech Conference on Very Large Scale Integration. California Institute of Technology , Pasadena, CA, pp. 135-151. https://resolver.caltech.edu/CaltechCONF:20120508-135820383

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